UN-GSWIR5014L

製品の特徴:

・φ28画像フォーマット用に開発
· 波長: 900～1700nm
· 大口径、最大F1.4
· コンパクトで軽量な設計

製品の特徴:

・φ28画像フォーマット用に開発
· 波長: 900～1700nm
· 大口径、最大F1.4
· コンパクトで軽量な設計

For Semiconductor Wafer Inspection, Biomedical Imaging, Logistics Package Sorting, Wildfire Detection & Ember Monitoring, etc.

· Developed for 1.1" image format
· Wavelength: 800-1700nm
· Large Aperture, up to F2.0
· Compact and lightweight design

For Intelligent Transportation Systems (ITS) Applications: Road Surveillance, ANPR/ALPR, Automatic Incident Detection, Traffic Enforcement Systems, Railway/Tunnel Safety Monitoring, etc.

· Excellent edge sharpness and uniform illumination
· Designed to resist strong light interference, adaptable to complex lighting conditions
· High stability and low distortion ensure measurement accuracy

製品の特徴:

· 広い作動距離範囲をカバー

· 距離と絞りの設定をロック可能

製品情報: リクエストに応じてカスタムデザインも承ります。

For high-end PCB AOI micro-inspection, Mini/Micro LED panel pixel defect detection, photovoltaic silicon wafer EL hidden crack inspection, narrow high-temperature metal strip flaw detection, luxury anti-counterfeit printing texture inspection, electronic ceramic substrate microscopic testing, UAV high-precision aerial survey mapping and ultra-precise online dimensional measurement of micro electronic components.

· Developed for 82mm big frame sensor
· Low distortion
· Compatible for 16K line scan camera
· Excellent optical performance, uniform imaging of center and edge

Product information: Custom designs are available upon request.